A Focused Ion Beam (FIB) system is a high-tech instrument used to precisely modify materials at the nanometer level.
The primary FIB application will be the preparation of ultra-thin slices of materials, which can subsequently be analyzed using Transmission Electron Microscopy (TEM).
- FIB system functions like a microscopic Swiss Army knife for research, with the capability to cut, shape, image and analyze the tiniest details of materials, says Justinas Palisaitis, associate professor at the division of thin film physics at LiU.
Additionally, the FIB/SEM system facilitates cross-sectional imaging, surface patterning, failure analysis and more. New Focused Ion Beam (FIB) systems present a leap in precision, speed, efficiency, and automation, driven by the advancements in dual-beam technology and the new FIB at LiU is no exception, says Justinas Palisaitis.
- It far exceeds the capabilities of its predecessor.
This includes high current and well-focused ion beams, advanced detectors and imaging modes (STEM-in-SEM), automated workflows, range of gases for deposition (e.g., platinum, tungsten and carbon), rotating manipulator needle and more.
- The new FIB system will provide significant benefits by revolutionizing the process of TEM sample preparation. It will enable the creation of ultra-thin and high-quality samples with incredible speed and precision, ensuring that researchers can target specific regions of interest within a material with unparalleled accuracy, says Justinas.
This capability not only saves valuable time in the sample preparation process but also enhances the quality of subsequent analysis. By accelerating sample preparation workflows, the new FIB system will broaden the scope and depth of scientific discovery in materials research.
- User licenses will be given after training that will commence in the next few weeks, and will be open to all at LiU, says Justinas Palisaitas.
Apply for access and training through the LIMS system. Funding for the system was provided through AFM and WISE.
